Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1670515 | Thin Solid Films | 2008 | 4 Pages |
Abstract
By electron-cyclotron resonance Ar plasma enhanced chemical-vapor deposition, Si and Ge epitaxial growth on Si(100) were achieved without substrate heating using SiH4 and GeH4, respectively, and formation of highly strained nanometer-order heterostructures of Si and Ge was demonstrated. Moreover, on atomic-order nitrided Si(100), Si epitaxial growth without substrate heating was also achieved, and it was confirmed that N atoms of about 0.8 atomic layer are confined within about a 3Â nm-thick region under present measurement accuracy. These results open the way to realization of highly strained nanometer-order heterostructures with local doping control.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Masao Sakuraba, Daisuke Muto, Masaki Mori, Katsutoshi Sugawara, Junichi Murota,