| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1670547 | Thin Solid Films | 2008 | 4 Pages |
Abstract
Photoluminescence (PL) spectroscopy has been used to study the incorporation of C in several samples consisting of strained Si1 − x − yGexCy epilayers lattice matched to Si (001). To obtain the total C concentration, these samples were characterized by both SIMS and Auger emission spectroscopy, and X-ray diffraction data was analyzed to obtain the substitutional C concentration. The difference of the total and substitutional C concentrations, i.e., the non-substitutional carbon fraction, was found to be directly correlated with specific spectral lines in both the room-temperature Raman and low-temperature PL spectra.
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Authors
N.L. Rowell, D.J. Lockwood, J.-M. Baribeau,