Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1670946 | Thin Solid Films | 2010 | 5 Pages |
Abstract
We demonstrate distributed Bragg reflector (DBR) enhanced electroluminescence from a silicon nanocrystal-based light emitting device. An a-Si/SiO2 superlattice containing silicon nanocrystals serves as the intrinsic layer in an n–i–n device that is embedded in a DBR cavity consisting of alternating layers of silicon and silicon dioxide. The entire structure, including DBR, superlattice and contact layers, is deposited by plasma-enhanced chemical vapor deposition. The photoluminescence, electroluminescence (EL) and optical output power are measured and compared to a reference device. The DBR is found to enhance the peak EL intensity by a factor of 25 and the external quantum and power conversion efficiencies by a factor of 2.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Tim Creazzo, Brandon Redding, Elton Marchena, Ruiying Hao, Janusz Murakowski, Shouyuan Shi, Dennis W. Prather,