Article ID Journal Published Year Pages File Type
1670946 Thin Solid Films 2010 5 Pages PDF
Abstract

We demonstrate distributed Bragg reflector (DBR) enhanced electroluminescence from a silicon nanocrystal-based light emitting device. An a-Si/SiO2 superlattice containing silicon nanocrystals serves as the intrinsic layer in an n–i–n device that is embedded in a DBR cavity consisting of alternating layers of silicon and silicon dioxide. The entire structure, including DBR, superlattice and contact layers, is deposited by plasma-enhanced chemical vapor deposition. The photoluminescence, electroluminescence (EL) and optical output power are measured and compared to a reference device. The DBR is found to enhance the peak EL intensity by a factor of 25 and the external quantum and power conversion efficiencies by a factor of 2.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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