| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1671016 | Thin Solid Films | 2010 | 4 Pages |
Abstract
We have investigated the optical properties of thick InGaN film grown on GaN by cathodeluminescence (CL) spectroscopy. It is found that there is obvious In composition variation in both growth and lateral direction of InGaN film. The depth distribution of In composition is closely related to the strain relaxation process of InGaN film. Accompanied with the relaxation of compressive strain, the In composition of InGaN layer increases and the CL peak energy shifts towards red. Moreover, a rather apparent In composition fluctuation is found in the relaxed upper part of InGaN layer as confirmed by CL imaging.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
H. Wang, D.S. Jiang, U. Jahn, J.J. Zhu, D.G. Zhao, Z.S. Liu, S.M. Zhang, H. Yang,