Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1671151 | Thin Solid Films | 2009 | 4 Pages |
Abstract
CuIn1 â xGaxTe2 thin films with x = 0, 0.5 and 1, have been prepared by flash evaporation technique. These semiconducting layers present a chalcopyrite structure. The optical measurements have been carried out in the wavelength range 200-3000 nm. The linear dependence of the lattice parameters as a function of Ga content obeying Vegard's law was observed. The films have high absorption coefficients (4 · 104 cmâ 1) and optical band gaps ranging from 1.06 eV for CuInTe2 to 1.21 eV for CuGaTe2. The fundamental transition energies of the CuIn1 â xGaxTe2 thin films can be fitted by a parabolic equation namely Eg1(x) = 1.06 + 0.237x â 0.082x2. The second transition energies of the CuInTe2 and CuGaTe2 films were estimated to be: Eg2 = 1.21 eV and Eg2 = 1.39 eV respectively. This variation of the energy gap with x has allowed the achievement of absorber layers with large gaps.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
O. Aissaoui, L. Bechiri, S. Mehdaoui, N. Benslim, M. Benabdeslem, X. Portier, H. Lei, J.L. Doualan, G. Nouet, A. Otmani,