Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1671172 | Thin Solid Films | 2009 | 4 Pages |
Abstract
The films, characterized by spectrophotometry (A%) and sheet resistance (R) by four-terminal sensing measurement, were classified in compositional groups by the use of the two-dimensional parameter (R, A%). Interestingly, the optical absorption A% was linearly correlated with Cu content in our compositional range while R presents a jump back related with the variation of S concentration. The independence of R and A% in this case is discussed in terms of different conduction mechanisms.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
J.F. Trigo, A. Bollero, J. Herrero, M.T. Gutiérrez,