Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1671422 | Thin Solid Films | 2008 | 5 Pages |
Abstract
Amorphous hydrogenated carbon nitride (a-CNx:H) films were prepared on Si and glass (SiO2) substrates using i-C4H10/N2 supermagnetron plasma chemical vapor deposition. By controlling the rf power ratio (i.e., keeping the upper electrode rf power [UPRF] at 800Â W but the lower electrode rf power [LORF] was varied in 0-100Â W), wide or narrow optical bandgap a-CNx:H films were realized. At LORF >Â 25Â W, the deposited a-CNx:H layers became hard and opaque. Optical bandgap of the films was below 0.8Â eV, electrical resistivity was low, and hardness was above 20Â GPa. At LORF <Â 20Â W, however, deposited a-CNx:H layers became soft and transparent. Optical bandgap of the films was above 1.9Â eV, electrical resistivity was high, and hardness was about 7Â GPa. Nitrogen atom concentrations of all of the films were 12.5-13.4 mass% at LORF of 10-100Â W.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Haruhisa Kinoshita, Ryo Ikuta, Tomuo Yamaguchi,