| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1671563 | Thin Solid Films | 2007 | 4 Pages |
Abstract
Optical, electrical and thermal properties of the deposited films were studied. The topography of the films was studied using AFM microscope. P-N structures were created using VOx films on silicon and glass substrates. Electrical measurements had shown a non-linear behaviour of the samples.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Alexander Axelevitch, Boris Gorenstein, Gady Golan,