Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1671592 | Thin Solid Films | 2007 | 4 Pages |
Abstract
In the direction of growth of fabricated films, the material near the free surface as well as the interface with the substrate exhibits properties which are different from those of the material in the bulk. The resulting spatial inhomogeneity of the refractive index influences positions and values of the extrema of optical spectra. We exploit this to derive the profile of the refractive index by developing a theoretical approach. In the calculations, taking the derived profile into account, we attain a good reproduction of the experimental Transmittance and Reflectance spectra from approximately 1 to 4 eV, the region of relatively weak refractive-index dispersion.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. Kondilis, E. Aperathitis, M. Modreanu,