| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1671621 | Thin Solid Films | 2007 | 5 Pages |
Abstract
Zinc Oxide films were deposited on quartz substrates by reactive rf magnetron sputtering of zinc target. The effect of substrate temperature on the crystallinity and band edge luminescence has been studied. The films deposited at 300 °C exhibited the strongest c-axis orientation. AFM and Raman studies indicated that the films deposited at 600 °C possess better overall crystallinity with reduction of optically active defects, leading to strong and narrow PL emission.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Sukhvinder Singh, R.S. Srinivasa, S.S. Major,