| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1671804 | Thin Solid Films | 2010 | 5 Pages |
Abstract
Structural and magnetic properties have been studied for polycrystalline Zn1 − xTMxO films where transition metal (TM) = Fe, Cr. The Zn1 − xTMxO films were prepared by the radio frequency magnetron sputtering technique on Al2O3 (001) substrates. The microstructures of the films are characterized by X-ray diffraction and X-ray photoelectron spectroscopy. TM in the films exists mainly in the form of TM2+, and the TM2+ ions have substituted for the Zn2+ ions bonded in TM–O in the ZnO lattice and do not change the wurtzite structure of ZnO. The result of magnetic measurement shows that the Zn1 − xTMxO films are ferromagnetic at 5 K and 300 K respectively. Subsequently, we discuss the origin of the ferromagnetism in the films.
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Authors
C.G. Jin, Y.Gao, X.M. Wu, M.L. Cui, L.J. Zhuge, Z.C. Chen, B. Hong,