| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1671827 | Thin Solid Films | 2010 | 5 Pages |
Abstract
We have deposited the c-axis-oriented orthorhombic TbMnO3 (o-TMO) films with well-aligned in-plane orientations on NdGaO3 (001) substrates by using pulsed laser deposition. The distinctive orientation alignments between the film and substrate allow the study of the X-ray absorption spectroscopy (XAS) with the electric field along three major crystallographic directions, respectively. Polarization-dependent XAS spectra show significant anisotropy in the electronic structure of o-TMO. The correlation between the electronic structure, the bonding anisotropy, and the magnetoelectric effect in the multiferroic materials is revealed.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
K.H. Wu, I.C. Gou, C.W. Luo, T.M. Uen, J.-Y. Lin, J.Y. Juang, C.K. Chen, J.M. Lee, J.M. Chen,