Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1671882 | Thin Solid Films | 2009 | 4 Pages |
Abstract
Integrated ZnO nanowires/thin film structures were grown using radio-frequency magnetron sputter deposition on amorphous glass substrates having an electroless plated copper surface layer. The growth took place under different deposition times and O2/Ar ratios. The substrate was not heated or biased during the deposition. Regardless of the O2/Ar ratio, both nanowires and the film grew simultaneously. However, the growth of the nanowires and the film was diffusion-controlled and reaction-controlled, respectively. On the other hand, the O2/Ar ratio substantially affected the crystal structure and morphology of the resulting ZnO deposits.
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Authors
T.L. Chou, W.Y. Wu, J.M. Ting,