| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1671959 | Thin Solid Films | 2009 | 5 Pages |
Abstract
A simple interference spectroscopy technique of determining real parts of refractive indices in thin isotropic or anisotropic films is presented. This method is based on the evaluation of the orders of extrema in interference spectra of optical transmittance and/or reflectance measured for various angles of light incidence. It also makes possible to determine thickness of the investigated sample. This method of investigations was used to determine the parameters of gallium selenide (GaSe). The determined spectral characteristics of ordinary and extraordinary refractive indices of GaSe are compared with the data presented in literature by other authors.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Mirosława Kępińska, Marian Nowak, Piotr Duka, Beata Kauch,