Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1672010 | Thin Solid Films | 2009 | 4 Pages |
Abstract
Photovoltaic properties of 4 µm thick microcrystalline silicon p–i–n solar cells have been studied, over a range of crystallinity determined using Raman spectroscopy. Low-crystallinity material (below 10%) appears to absorb disproportionately strongly in the infrared, possibly due to increased light scattering or to relaxation of the crystal momentum selection rule. A minimum in solar cell efficiency is observed under AM1.5 illumination when VOC ≈ 580 mV, with blue response most strongly affected. This is consistent with a reduction in electron mobility to a value below that of amorphous silicon for low-crystallinity material, in agreement with time-of-flight measurements.
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Physical Sciences and Engineering
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Authors
Steve Reynolds, Reinhard Carius, Friedhelm Finger, Vladimir Smirnov,