| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1672058 | Thin Solid Films | 2008 | 5 Pages |
Abstract
Low dimensional nanostructures of YTaO4:Nb thin films were deposited on Si (100) substrate using pulsed laser deposition (λ = 193 nm) at room temperature. X-ray Diffraction, Scanning Electron Microscopy and Transmission Electron Microscopy analysis revealed the nanocrystalline nature of YTaO4:Nb film consisting of grains of 20–40 nm in size. The photoluminescence spectra measured on the films confirmed the luminescence characteristics of YTaO4:Nb powders, the emission peak appeared shifted as compared to the luminescence spectrum of the bulk target. The spectral shift is about 15 nm and is correlated to the nanocrystalline nature of the film.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Amalia Mesaros-Hristea, Oscar Alm, Elisabeth-Jeanne Popovici, Mats Boman,