Article ID Journal Published Year Pages File Type
1672381 Thin Solid Films 2008 5 Pages PDF
Abstract

Polymeric perfluorocarbon was deposited on the Si, Ag and Al substrates in Ar/c-C4F8 plasmas under a deposition rate of 10 nm/h for seven hours. The X-ray photoelectron spectra and atomic force microscope images of the deposited materials were observed. As a result, it has been found that the surface structure and chemical bonding of the deposited materials are remarkably different from each other, depending on the kind of substrate.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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