Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1672395 | Thin Solid Films | 2008 | 4 Pages |
Abstract
Single-phase tetragonal FeSe films were grown on c-plane sapphire, SiO2, GaAs (100) and Si (100) substrates by low-pressure metal-organic chemical vapor deposition method. X-ray diffraction analysis shows that all the FeSe thin films on different substrates are of (00l) orientation. Spin-dependent magnet tunnel junction with Fe/ZnSe/FeSe structure were fabricated, and the tunneling magnetic resistance ratio decreased with increasing the thickness of ZnSe layer in the range of 10–20 nm.
Related Topics
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Materials Science
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Authors
X.J. Wu, Z.Z. Zhang, J.Y. Zhang, Z.G. Ju, B.H. Li, B.S. Li, C.X. Shan, D.X. Zhao, B. Yao, D.Z. Shen,