Article ID Journal Published Year Pages File Type
1672395 Thin Solid Films 2008 4 Pages PDF
Abstract

Single-phase tetragonal FeSe films were grown on c-plane sapphire, SiO2, GaAs (100) and Si (100) substrates by low-pressure metal-organic chemical vapor deposition method. X-ray diffraction analysis shows that all the FeSe thin films on different substrates are of (00l) orientation. Spin-dependent magnet tunnel junction with Fe/ZnSe/FeSe structure were fabricated, and the tunneling magnetic resistance ratio decreased with increasing the thickness of ZnSe layer in the range of 10–20 nm.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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