Article ID Journal Published Year Pages File Type
1672485 Thin Solid Films 2009 4 Pages PDF
Abstract

This paper presents the characterization of single-mode waveguides for 980 and 1550 nm wavelengths. High quality planar waveguide structure was fabricated from Y1 − xErxAl3(BO3)4 multilayer thin films with x = 0.02, 0.05, 0.1, 0.3, and 0.5, prepared through the polymeric precursor and sol-gel methods using spin-coating. The propagation losses of the planar waveguides varying from 0.63 to 0.88 dB/cm were measured at 632.8 and 1550 nm. The photoluminescence spectra and radiative lifetimes of the Er3+ 4I13/2 energy level were measured in waveguiding geometry. For most samples the photoluminescence decay was single exponential with lifetimes in between 640 μs and 200 μs, depending on the erbium concentration and synthesis method. These results indicate that Er doped YAl3(BO3)4 compounds are promising for low loss waveguides.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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