Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1672826 | Thin Solid Films | 2009 | 5 Pages |
Abstract
Nanoscopic defects present in ultrathin (~ 6 nm) silica films covalently attached to gold substrates through a gold oxide layer exhibit a voltammetric response consistent with a random array of ultramicroelectrodes. These pinholes can be passivated via electrochemical polymerization of phenol to create insulating poly(phenylene) oxide plugs as documented by atomic force microscopy and infrared reflectance-absorbance spectroscopy. Passivation of pinholes is ~ 99.5% complete after 550 voltammetric cycles of oxidative electropolymerization.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Piotr Macech, Jeanne E. Pemberton,