Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1672927 | Thin Solid Films | 2008 | 5 Pages |
Abstract
Impedance measurements of alumina scales on Fecralloy substrates were made at temperature from 400 °C to 650 °C. The alumina scales were also examined using scanning electron microscopy, transmission electron microscopy, coupled with energy dispersive X-ray analysis. Impedance spectra of the alumina scale in modulus format indicate that the thickness of the alumina can be measured based on impedance measurements whereas the change of impurity level in the alumina can be monitored according to variation of activation energy for electrical conduction.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Lifen Deng, Ping Xiao,