| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1672996 | Thin Solid Films | 2007 | 4 Pages |
Abstract
The optical and electrical properties of indium tin oxide (ITO) thin films deposited using a pulsed laser deposition at room temperature can be substantially enhanced by adopting a two-step process. X-ray diffraction patterns and atomic force microscopy images were used to observe the structural properties of the films. High quality ITO films grown by two-step process could be obtained with the resistivity of 3.02 Ã 10â 4 Ω cm, the carrier mobility of 32.07 cm2/Vs, and the transparency above 90% in visible region mainly due to the enhancement of the film crystallinity and the increase of grain size.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jong Hoon Kim, Byung Du Ahn, Choong Hee Lee, Kyung Ah Jeon, Hong Seong Kang, Gun Hee Kim, Sang Yeol Lee,
