Article ID Journal Published Year Pages File Type
1672996 Thin Solid Films 2007 4 Pages PDF
Abstract
The optical and electrical properties of indium tin oxide (ITO) thin films deposited using a pulsed laser deposition at room temperature can be substantially enhanced by adopting a two-step process. X-ray diffraction patterns and atomic force microscopy images were used to observe the structural properties of the films. High quality ITO films grown by two-step process could be obtained with the resistivity of 3.02 × 10− 4 Ω cm, the carrier mobility of 32.07 cm2/Vs, and the transparency above 90% in visible region mainly due to the enhancement of the film crystallinity and the increase of grain size.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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