Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1673174 | Thin Solid Films | 2009 | 5 Pages |
Abstract
Nitrogen doped amorphous carbon (a-C:N) thin films were deposited on p-Si substrates by DC magnetron sputtering at varying substrate temperature from room temperature (RT) to 300 °C. The bonding structure, surface morphology and adhesion strength of the a-C:N films were investigated by using X-ray photoelectron spectroscopy (XPS), micro-Raman spectroscopy, atomic force microscopy (AFM) and micro-scratch testing. The corrosion behavior of the a-C:N films was evaluated by potentiodynamic polarization test in a 0.6 M NaCl solution. The results indicated that the corrosion resistance of the films depended on the sp3-bonded cross-link structure that was significantly affected by the substrate temperature.
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Physical Sciences and Engineering
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Authors
N.W. Khun, E. Liu,