Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1673194 | Thin Solid Films | 2009 | 4 Pages |
Abstract
The characterizations (i.e., film adhesion, optical reflectivity, illumination aging and anti-corrosion behavior) should be considered for the metallic thin film served as a candidate of autolamp materials. The characterizations of three candidates (i.e., sputtered Al-0.11Â wt.% Sc, sputtered pure Al, and thermally evaporated pure Al) have been investigated and compared. The sputtered Al-0.11Â wt.% Sc film performed much better than any of the other two regarding the characterizations concerned. Examining through AFM, the sputtered Al-0.11Â wt.% Sc revealed better surface property (including flatness and smoothness) than the others. Excellence in surface properties and optical reflectivity for the Al-0.11Â wt.% Sc may arise from grain refinement in the film. Under long-term illumination, the films led to grain growth and hillocks formation. This illumination aging degraded the surface properties and optical reflectivity of the films, especially for the pure Al films. The sputtered Al-0.11wt.%Sc revealed more corrosion-resistance than the other films in 5% NaCl solution regardless whether or not under illumination aging.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Hsueh-Lung Liao, Jing-Chie Lin, Yu-Sheng Chen, Cheng-Lin Chuang, Sheng-Long Lee,