Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1673501 | Thin Solid Films | 2008 | 4 Pages |
Abstract
C K-edge X-ray absorption near-edge structure (XANES) and valence-band photoemission spectroscopy (PES) measurements were taken for hydrogenated amorphous carbon films before and after ion beam irradiation. The C K-edge XANES and valence-band PES spectra indicate that irradiation breaks C–C bonds to form CC bonds and has a similar effect on the electronic structures of the films, irrespective of the hydrogen content. The valence-band PES measurements reveal that ion beam irradiation markedly enhances the density of carbon π states in the vicinity of the Fermi level.
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Authors
S.C. Ray, K.P. Krishna Kumar, H.M. Tsai, J.W. Chiou, C.W. Pao, W.F. Pong, M.-H. Tsai, B.-H. Wu, C.-R. Sheu, C.-C. Chen, Franklin C.-N. Hong, H.-H. Cheng, A. Dalakyan,