Article ID Journal Published Year Pages File Type
1673527 Thin Solid Films 2008 4 Pages PDF
Abstract

To investigate the relationship between molecular orientation and current voltage (J–V) characteristics, molecular orientation and J–V characteristics have been simultaneously measured in some indium tin oxide (ITO)/X/Al structures. X were thin films fabricated from poly(3-hexylthiophene) (P3HT), coumarin6 dispersed in poly(N-vinylcarvazole), or biomolecular hemin (Hm). The results have shown that the orientation change of the P3HT chain causes a reproducible loop of the J–V characteristics in P3HT thin film, and that the peak observed in the J–V characteristics in Hm is associated with irreversible molecular orientation change.

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Physical Sciences and Engineering Materials Science Nanotechnology
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