Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1674005 | Thin Solid Films | 2007 | 6 Pages |
Abstract
We developed a phase retrieval algorithm that utilizes pre-determined partial phase information to overcome insufficient oversampling ratio in diffraction data. Implementing the Fourier modulus projection and the modified support projection manifesting the pre-determined information, a generalized difference map and HIO (Hybrid Input-Output) algorithms are developed. Optical laser diffraction data as well as simulated X-ray diffraction data are used to illustrate the validity of the proposed algorithm, which revealed the strength and the limitations of the algorithm. The proposed algorithm can expand the applicability of the diffraction based image reconstruction.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S.S. Kim, S. Marathe, S.N. Kim, H.C. Kang, D.Y. Noh,