| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1674035 | Thin Solid Films | 2007 | 4 Pages |
Abstract
Neutron reflectivity is a powerful tool for the investigation of interfaces and multilayers in both soft matter and biophysics as well as in solid state physics. In recent years, in addition to the density profile extracted from specular scattering, off specular reflectivity and grazing incident small angle scattering providing information on in plane correlations attract more and more interest. In the present manuscript we report on recent advances and future perspectives of the reflectometer ADAM at the ILL.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M. Wolff, K. Zhernenkov, H. Zabel,