| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1674184 | Thin Solid Films | 2009 | 8 Pages |
Abstract
The effects of LaNiO3 (LNO) and Pt electrodes on the properties of Pb(Zrx,Ti1 − x)O3 (PZT) films were compared. Both LNO and PZT were prepared by chemical solution deposition (CSD) methods. Specifically, the microstructure of LNO and its influence on the PZT properties were studied as a function of PbO excess. Conditions to minimize the Pyrochlore phase and porosity were found. Remnant polarization, coercive field and fatigue limit were improved in the PZT/LNO films relative to the PZT/Pt films. Additionally, the PZT crystallization temperature over LNO was 500 °C, about ~ 50 °C lower than over Pt. The crystallization temperature reported here is amongst the lowest values for CSD-based PZT films.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Itzik Shturman, Gennady E. Shter, Aleksey Etin, Gideon S. Grader,