Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1674220 | Thin Solid Films | 2007 | 4 Pages |
Abstract
The microstructural properties of the β-FeSi2/FeSi structure prepared from a molten salt have been characterized using transmission electron microscopy (TEM). The β-FeSi2 films were grown on FeSi substrates at the heat treatment temperature of 900 °C from 1 min to 24 h using the molten salt technique. It is found that the films consisted of a thin surface layer and a thick underlying layer with columnar-shaped domains. The crystallographic directions of the domains are mostly randomly oriented. The β-FeSi2 domains in the film, however, have specific crystallographic orientation relationships with the adjoining domains and the FeSi substrate. A high density of the stacking faults on the β-FeSi2 (100) planes was also observed through the films. Moreover, the growth evolution of the β-FeSi2 domains, the defect characteristics and the formation mechanism of the defects are discussed.
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Authors
T. Ohishi, A. Mishina, I. Yamauchi, T. Matsuyama, H. Tatsuoka,