Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1674333 | Thin Solid Films | 2008 | 8 Pages |
Abstract
Since Bi2O3–ZnO–Nb2O5 (BZN) pyrochlore thin films have been introduced as a tunable dielectric, the substitution of Bi with Pb could be a reasonable choice. The PbO–ZnO–Nb2O5 (PZN) cubic pyrochlore thin films were produced by radio frequency sputtering, and their dielectric properties, in terms of tunability, were measured. Up to 33.4% of tunability and comparable K factors with BZN films were obtained. The effects of film crystallization, along with substrate heating and post-annealing on the dielectric properties, were similar to those of BZN. However, strong texturing developed in the PbO–ZnO–Nb2O5 (PZN) films deposited at a high substrate temperature, which caused degradation of the loss tangent and K factor.
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Authors
Young Pyo Hong, Kyung Hyun Ko, Hyuk Jun Lee, Geun-Kyu Choi, Sung Hun Yoon, Kug Sun Hong,