Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1674390 | Thin Solid Films | 2007 | 4 Pages |
Abstract
Recently InXGa1−XN/GaN heterostructures and quantum wells (QWs) have gained immense importance in the application of III–V nitride materials. Reported values of the ratios of conduction band offset to valence band offset for InXGa1−XN/GaN QW structures, ΔEc:ΔEv, vary widely from 38:62 to 83:17. While trying to explain the unusual shifts in the photoluminescence (PL) spectra, obtained from InXGa1−XN/GaN QW structures, it has been found that a band offset ratio, ΔEc:ΔEv = 55:45, explains all the experimental data precisely. In this paper detailed theories, procedures, results and discussions to establish the newly estimated band offsets will be presented.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Dipankar Biswas, Subindu Kumar, Tapas Das,