| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1674468 | Thin Solid Films | 2008 | 5 Pages |
Abstract
The effects of annealing under various atmospheres on the electrical properties of Cu(In,Ga)Se2 (CIGS) films and CdS/CIGS heterostructures were investigated. For CIGS films without CdS, the electrical properties of CIGS degraded under vacuum and O2 annealing, although such degradations were not observed under N2 annealing. For the CdS/CIGS heterostructures, the electrical properties of the junctions improved after annealing under all gas ambients. Therefore, CdS films prevent the chemical reactions at the CIGS surfaces and are necessary for effectively annealing the CIGS film. We observed a distinct correlation between the degradation of the electrical properties and increase in the defect density. Finally, we discussed the origin of the defect states.
Related Topics
Physical Sciences and Engineering
Materials Science
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Authors
T. Sakurai, N. Ishida, S. Ishizuka, M.M. Islam, A. Kasai, K. Matsubara, K. Sakurai, A. Yamada, K. Akimoto, S. Niki,