Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1675069 | Thin Solid Films | 2006 | 7 Pages |
Abstract
This work provides the basis for a “fingerprint” analysis of the microstructure and the texture of anatase thin films by using Fourier transform infrared spectroscopy. For this, a formalism that reproduces the experimental spectra has been developed and its applicability is analysed for anatase thin films with different microstructure (columnar and porous, with varying degrees of compactness) and texture. The rather good agreement between calculated and experimental spectra observed in all cases demonstrated that a systematic use of this non-destructive technique can be very useful for the characterization of thin films.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Manuel Ocaña, Carlos Pecharromán, Francisco Gracía, Juan P. Holgado, Agustín R. González-Elipe,