Preparation and optical characterization of lanthanum modified lead zirconate titanate thin films on indium-doped tin oxide-coated glass substrate

Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on indium-doped tin oxide (ITO)-coated glass substrate by sol–gel method. The structure of the films was characterized with X-ray diffraction and scanning electron microscopy. The optical properties were investigated in the wavelength range of 220–2400 nm. The sample was modelled as a three layer structure on finite substrate, and optical constants of this system were calculated from the transmission and reflection spectra. The calculated dielectric function was fitted with the Drude model in the case of ITO and a sum of Lorentzian oscillators in the case of PLZT films. For PLZT film the anomalous behaviour of imaginary part of dielectric function was observed below the absorption edge. The possible reasons of that behaviour were discussed.