Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1675117 | Thin Solid Films | 2006 | 5 Pages |
Abstract
BaTiO3/SrTiO3, SrZrO3/SrTiO3 and BaTiO3/BaZrO3 artificial superlattices were fabricated by the molecular beam epitaxy process. X-ray diffraction (XRD) reciprocal space mapping measurement was performed using high-resolution XRD. In all artificial superlattices, the superlattices with the 10-periodic structure showed the clear satellite peaks in the XRD pattern and were mostly distorted in the direction of film thickness. Superlattices with the 10-periodic structure showed a high dielectric permittivity of εr = 33,000 or artificially induced ferroelectricity. It was clarified that the anisotropic lattice distortion introduced by the strains due to the lattice mismatch was the origin of the unique dielectric characteristics of artificial superlattices.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Takakiyo Harigai, Song-Min Nam, Hirofumi Kakemoto, Satoshi Wada, Keisuke Saito, Takaaki Tsurumi,