| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1675507 | Thin Solid Films | 2007 | 6 Pages |
Abstract
Optical investigations of absorption show a considerable dependence of position of the fundamental edges on the thickness of the films. The observed maxima of absorption at â¼Â 3.6 eV are related with the defect states, mainly, with oxygen vacancies of non-stoichiometric oxide.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
E.P. Domashevskaya, S.V. Ryabtsev, Yu.A. Yurakov, O.A. Chuvenkova, V.M. Kashkarov, S.Yu. Turishchev, S.B. Kushev, A.N. Lukin,