Article ID Journal Published Year Pages File Type
1675520 Thin Solid Films 2007 6 Pages PDF
Abstract

BiFeO3 thin films were grown on (001) SrTiO3 and (001) ZrO2(Y2O3) substrates by single source metalorganic chemical vapor deposition in the temperature range T = 500 ÷ 800 °C using Fe(thd)3 and Bi(C6H5)3 as volatile precursors. X-ray diffraction analysis shows cube-on-cube epitaxial growth of BiFeO3 on (001) SrTiO3. The strongly reduced bismuth transfer into the film due to the high thermal stability of Bi(C6H5)3 was counterbalanced by the increase of the total pressure as well as of the residence time of the precursor flow in the reactor; the Bi/Fe ratio in the film thus becomes close to that in the precursor mixture. Optical second harmonic generation measurements have evidenced the ferroelectric ordering in BiFeO3 films and the apparent decrease of the Curie temperature of the strained films as compared to BiFeO3 single crystal.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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