Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1675538 | Thin Solid Films | 2007 | 5 Pages |
Abstract
Thin films containing beta barium borate (β-BaB2O4 so called β-BBO) were grown on silicon (100) substrates by injection metal organic chemical vapour deposition for different deposition temperatures. The films were characterized by optical microscopy, micro-Raman spectroscopy and X-ray photoelectron Spectroscopy (XPS). The micro-Raman spectra show an intense peak at 637 cm− 1 that is the fingerprint of β-BBO. Our XPS analysis permits the measurement of the Ba, B and O core levels, which are reported here for the first time for β-BBO thin films. The formation of a new spectral component appearing with lower growth temperatures has been observed as well.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S. Wersand-Quell, G. Orsal, P. Thévenin, A. Bath,