Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1675594 | Thin Solid Films | 2006 | 4 Pages |
Abstract
A comparison between biaxially aligned MgO and Cr concerning the microstructure and crystallographic texture is discussed. A correlation between the sputter deposition parameters on the biaxial alignment of both materials is observed. Both materials have a columnar V-shape structure with a faceted surface, corresponding to zone T of the well known structure zone model of Thornton. The MgO layers exhibit a [111] out-of-plane orientation, while Cr layers have an [100] preferential orientation. MgO as well as Cr show a strong in-plane alignment.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
P. Ghekiere, S. Mahieu, R. De Gryse, D. Depla,