| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1675680 | Thin Solid Films | 2006 | 5 Pages |
Abstract
The microstructure of self-assembled dysprosium silicide nanostructures on silicon(001) has been studied by scanning tunneling microscopy and transmission electron microscopy. The studies focused on nanostructures that involve multiple atomic layers of the silicide. Cross-sectional high resolution transmission electron microscopy images and fast Fourier transform analysis showed that both hexagonal and orthorhombic/tetragonal silicide phases were present. Both the magnitude and the anisotropy of lattice mismatch between the silicide and the substrate play roles in the morphology and epitaxial growth of the nanostructures formed.
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Authors
Gangfeng Ye, Jun Nogami, Martin A. Crimp,