Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1675884 | Thin Solid Films | 2007 | 5 Pages |
Abstract
Aluminum doped ZnO thin films (ZnO:Al) were deposited on glass and poly carbonate (PC) substrate by r.f. magnetron sputtering. In addition, the electrical, optical properties of the films prepared at various sputtering powers were investigated. The XRD measurements revealed that all of the obtained films were polycrystalline with the hexagonal structure and had a preferred orientation with the c-axis perpendicular to the substrate. The ZnO:Al films were increasingly dark gray colored as the sputter power increased, resulting in the loss of transmittance. High quality films with the resistivity as low as 9.7 × 10− 4 Ω-cm and transmittance over 90% have been obtained by suitably controlling the r.f. power.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jaehyeong Lee, Dongjin Lee, Donggun Lim, Keajoon Yang,