Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1676008 | Thin Solid Films | 2006 | 6 Pages |
Abstract
Composition modulation in copper/cobalt (copper) multilayers grown by a pulse train based deposition technique has been studied using grazing angle X-ray diffraction and X-ray photoelectron spectroscopy techniques. Higher pulse frequency employed during pulse electrodeposition, has been shown to yield a mixed copper/cobalt phase. Formation of coherent multilayers exhibiting antiphase oscillation of the Cu/Co composition profile has been demonstrated using pulse frequency (duty cycles) of 200Â Hz (50%) and 400Â Hz (80%) for copper and cobalt electrodeposition, respectively.
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Authors
Dhirendra Gupta, A.C. Nayak, M. Sharma, R.R. Singh, S.K. Kulkarni, R.K. Pandey,