Article ID Journal Published Year Pages File Type
1676015 Thin Solid Films 2006 12 Pages PDF
Abstract

Diffusional phase transformations in stressed solid films are simulated by using an analytical solution for the elastic fields together with a numerical solution for the composition evolution. Isotropic and anisotropic (cubic) films are considered, where the film is either free-standing or attached to a substrate. Stresses in the film arise owing to both compositional self-stress and, in the film–substrate case, misfit between the film and substrate. Stresses are found by using analytical elastic solutions we developed for both the two- and three-dimensional cases. Numerical simulations in both two- and three-dimensions are performed using a Cahn–Hilliard model for the composition evolution. Results show that elastic strength, epitaxial misfit, elastic anisotropy, external mechanical loading and film–substrate geometry affect both the kinetics of evolution and the long-time configurations of the evolution. In particular, we observe phenomena such as formation of columnar structures, switching of layers, and phase alignment in preferred directions.

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Physical Sciences and Engineering Materials Science Nanotechnology
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