Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1676272 | Thin Solid Films | 2006 | 4 Pages |
Abstract
We report the growth of Cr1−δTe films on (100) GaAs substrates using ZnTe buffer layers by solid-source molecular-beam epitaxial technique. RHEED patterns indicate a clear structural change during the initial stages of deposition. Temperature-dependent magnetization results reveal that different NiAs-related phases of Cr1−δTe can be obtained at different substrate temperatures. By varying the film thickness, a metastable zinc blende structure of CrTe could be obtained at lower substrate temperature.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M.G. Sreenivasan, X.J. Hou, K.L. Teo, M.B.A. Jalil, T. Liew, T.C. Chong,