Correlation of atomic force–distance microscopy and spectrophotometric techniques in the analysis of optical multilayer spectral aging process

Aging-related multilayer spectral instabilities can pose severe performance limiting constraints to optical multilayer devices. In this study such instabilities of some periodic Gd2O3/SiO2 optical multilayer systems have been explored using scanning probe force–distance microscopy and spectrophotometric techniques. In the present case, a strong correlation between the spectral instabilities and the viscoelastic properties of the associated thin film layers has been distinctly noticed. From the experimental analysis it was quite evident that the spectral instability, which starts during the nucleation and growth stage in thin films, continues to persist at a much longer time scale following aging processes. In this study it is shown that the elastic properties of the constituent thin films, the layer design and the bilayer thickness have established a strong interrelation which ultimately contributes to the multilayer instabilities. These spectral instabilities also have strong interconnections with the morphological and viscoelastic changes in such multilayers. Other multilayer parameters like the total number of layers, the layer structure, the microroughness evolutions, related stiffness factors and the adhesion properties of the periodic layer systems contribute substantially to this instability process.