Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1676399 | Thin Solid Films | 2006 | 5 Pages |
Abstract
Epitaxial growth of GaN on β-Ga2O3 single crystal substrates by the molecular beam epitaxy technique is demonstrated for the first time. Standard and in-plane X-ray diffraction evidence the growth of c-plane wurtzite GaN on a-plane β-Ga2O3, the epitaxial relationship being 〈0 1 0〉Ga2O3‖ 〈1 1 2¯ 0〉GaN and 〈0 0 1〉Ga2O3‖〈1¯ 1 0 0〉GaN. Epitaxial growth without any buffer layer is achieved after an effective surface nitridation under NH3 gas.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Encarnación G. Víllora, Kiyoshi Shimamura, Kazuo Aoki, Kenji Kitamura,