| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1676420 | Thin Solid Films | 2006 | 6 Pages |
Abstract
The thin film model in free-electron approximation is considered. A discrete Fermi surface is constructed depending on the film thickness and electron density. The Fermi wavevector, the mean energy per one electron and the density of states at the Fermi surface are calculated for the films with various thicknesses and different crystallographic orientation.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
T. Balcerzak,