Article ID Journal Published Year Pages File Type
1676446 Thin Solid Films 2007 9 Pages PDF
Abstract

The optical reflectance and transmittance of an ideal thin film are calculated in a well-known way. As far as a non-ideal thin film is concerned – i.e., a slightly inhomogeneous thin film bounded by rough, unparallel interfaces – three categories of spectral coefficients can be defined, i.e.: specular reflectance and direct transmittance (light intensity flux along the optical axis), hemispherical reflectance and transmittance (light intensity flux integrated over the solid half angle π), and diffuse reflectance and transmittance (light intensity flux scattered around the optical axis) coefficients. In this paper a model recently introduced for the specular and direct coefficients is generalized to calculate also the hemispherical and diffuse coefficients of a non-ideal film.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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