Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1676630 | Thin Solid Films | 2006 | 6 Pages |
Abstract
A chelating and spin-coating procedure was used to prepare antiferroelectric thin films of Pb0.99Nb0.02[(Zr0.84Sn0.16)0.982Ti0.018]0.98O3. By controlling substrate and thermal processing conditions, films with strong (100) and (111) textures, as well as without textures, were prepared. These antiferroelectric films showed the characteristic double hysteresis polarization vs. electric field loops. An orientation dependence of the critical field for the antiferroelectric-to-ferroelectric phase transition was also observed. In addition, when the applied voltage exceeded a critical level during the first “ramp up,” an abnormal reduction in the area of the hysteresis loop was noticed in the (100) and (111) textured films.
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Authors
Weiguo Qu, Xiaoli Tan,